Method for characterising a particle on the basis of a hologram
US12135273B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 16, 2019 |
| Grant date | Nov 5, 2024 |
| Priority date | — |
| Expiry date | May 23, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2001/0447
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing a particle present in a sample, the sample lying between an image sensor and a light source and the sensor lying in a detection plane, includes illuminating the sample with the light source which emits an incident light wave propagating along a propagation axis, and acquiring an image of the sample with the sensor. The sensor is exposed to an exposure light wave. The image includes a plurality of elementary diffraction patterns each corresponding to one particle. The method also includes reconstructing a complex image representative of a complex amplitude of the light wave on a reconstruction surface passing through the sample, based on the acquired image; selecting a region of interest of the complex image corresponding to a particle of interest; forming an extracted image based on the region of interest; and characterizing the particle of interest depending on the extracted region of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.