Automated fault injection testing
US12135635B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2023 |
| Grant date | Nov 5, 2024 |
| Priority date | — |
| Expiry date | Jan 30, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3698
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An automated fault injection testing and analysis approach drives fault injection into a processor driven instruction sequence to quantify and define susceptibility to external fault injections for manipulating instruction execution and control flow of a set of computer instructions. A fault injection such as a voltage or electromagnetic pulse directed at predetermined locations on a processor (Central Processing Unit, or CPU) alters a result of a processor instruction to change values or execution paths. One or more quantified injections define an injection chain that causes a predictable or repeatable deviant result from an expected execution path through the code executed by the processor. Based on accumulation of fault injections and results, a repeatable injection chain and probability identifies an external action taken on a processing device to cause unexpected results that differ from an expected execution of a program or set of computer instructions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.