Patent · US Active

Method and system for characterizing a nanostructure by machine learning

US12136033B2 · kind B2 · utility

0Cited by

0References

20Claims

0Family size

Assignee

Ramot at Tel-Aviv University Ltd. · IL

Inventors

Lior Wolf · Cambridge, US
Haim Suchowski · Kfar Mordechai, IL
Michael Mrejen · Jerusalem, IL
Achiya Nagler · Tel Aviv-Yafo, IL
Itzik Malkiel · Givatayim, IL
Uri Arieli · Tel Aviv-Yafo, IL

Key dates

Filing date	Feb 9, 2018
Grant date	Nov 5, 2024
Priority date	—
Expiry date	Nov 26, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/258
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of designing a nanostructure, comprises: receiving a far field optical response and material properties; feeding the synthetic far field optical response and material properties to an artificial neural network having at least three hidden layers; and extracting from the artificial neural network a shape of a nanostructure corresponding to the far field optical response.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.