Patent · US Active

Systems and methods for determining examination parameters

US12138102B2 · kind B2 · utility

0Cited by
1References
19Claims
0Family size

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Inventors

Key dates

Filing dateNov 21, 2022
Grant dateNov 12, 2024
Priority date—
Expiry dateMay 16, 2043

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B6/547
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

Systems and methods for determining one or more target examination parameters is provided. The methods may include obtaining target examination information of a subject and generating one or more initial examination parameters based on the target examination information. The methods may further include obtaining one or more historical examination parameters associated with the subject and updating at least one of the one or more initial examination parameters based on the one or more historical examination parameters to obtain one or more target examination parameters. The one or more target examination parameters may be used for performing a target examination on the subject.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.