Patent · US Active

Wafer processing apparatus and control method thereof

US12140505B2 · kind B2 · utility

0Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 2021
Grant dateNov 12, 2024
Priority date
Expiry dateSep 14, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68735
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A wafer processing apparatus includes a vacuum chuck on which a wafer is seated, a ring cover installed on a circumferential portion of the vacuum chuck, a medium supply part connected to the vacuum chuck to supply an inspection medium to the vacuum chuck, and a sealing ring which is installed in the vacuum chuck to support the wafer and into which the inspection medium supplied to the vacuum chuck is introduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.