Patent · US Active

Method of finding optimized analog measurement hardware settings as well as method of measuring a device under test

US12140630B2 · kind B2 · utility

0Cited by

4References

11Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Darren Tipton · Reading, GB
Michael Simon · O'Fallon, US
Florian Ramian · Munich, DE
Martin Breinbauer · Munich, DE

Key dates

Filing date	Dec 10, 2021
Grant date	Nov 12, 2024
Priority date	—
Expiry date	Dec 15, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/3191
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Embodiments of the present disclosure relate to methods of finding optimized analog measurement hardware settings of a measurement system for a target measurement. The method can include one or more of the following steps: applying initial settings to the measurement system; varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal; performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.