Method for measuring phase currents of a device under test, in particular of an inverter
US12140649B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 3, 2021 |
| Grant date | Nov 12, 2024 |
| Priority date | — |
| Expiry date | Mar 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/1284
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is for measuring phase currents of a device under test, in particular of an inverter, in which a sensor arrangement, which has a component including a crystal lattice with a defect, is arranged in a region of the device under test. The method includes using the sensor arrangement to detect a magnetic field formed by a vector of magnetic fields, the magnetic fields each in turn being brought about by one of the phase currents of the device under test, and calculating a vector of the phase currents from the vector of the magnetic fields based on a coefficient matrix.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.