Patent · US Active

Method for measuring phase currents of a device under test, in particular of an inverter

US12140649B2 · kind B2 · utility

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10Claims
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Assignee

Inventors

Key dates

Filing dateMar 3, 2021
Grant dateNov 12, 2024
Priority date
Expiry dateMar 3, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/1284
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method is for measuring phase currents of a device under test, in particular of an inverter, in which a sensor arrangement, which has a component including a crystal lattice with a defect, is arranged in a region of the device under test. The method includes using the sensor arrangement to detect a magnetic field formed by a vector of magnetic fields, the magnetic fields each in turn being brought about by one of the phase currents of the device under test, and calculating a vector of the phase currents from the vector of the magnetic fields based on a coefficient matrix.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.