In-situ testing system for semiconductor device in aerospace irradiation environment
US12146908B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 10, 2024 |
| Grant date | Nov 19, 2024 |
| Priority date | — |
| Expiry date | Apr 10, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention discloses an in-situ testing system for semiconductor device in aerospace irradiation environment. The present invention includes a static testing unit, a static testing channel, a dynamic testing unit, a dynamic testing channel, and a channel switching control unit; the static testing unit is connected to the device under test through the static testing channel, and is used to output static testing signals and display the static testing data of the device under test; the dynamic testing unit is connected to the device under test through the dynamic testing channel, and is used to output dynamic testing signals and display the dynamic testing data of the device under test; the channel switching control unit is connected to the static testing channel and the dynamic testing channel, respectively. This invention can achieve static, dynamic, and degradation testing of third-generation semiconductor device in aerospace irradiation environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.