Characterizing fault injection on power distribution networks with voltage sensors
US12147284B2 · kind B2 · utility
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Key dates
| Filing date | Mar 28, 2022 |
| Grant date | Nov 19, 2024 |
| Priority date | — |
| Expiry date | Apr 11, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/75
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Power and electromagnetic fault injection vulnerabilities in an integrated circuit (IC) can be characterized sampling one or more integrated timing sensors in real-time or by equivalent-time sampling. To achieve equivalent-time sampling, a series of fault injection attempts are performed. An array of timing sensors implemented in part of the IC capture a measure of relative propagation delay, which fluctuates proportionally with instantaneous voltage. Increased voltage fluctuation can indicate elevated probability of faults in digital logic. Related apparatus, systems, techniques and articles are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.