Smart test data workload generation
US12147330B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 22, 2021 |
| Grant date | Nov 19, 2024 |
| Priority date | — |
| Expiry date | Jan 20, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In an approach for smart test data workload generation, a processor receives a plurality of expected image frames for a user interface application to be tested. The plurality of expected image frames is pre-defined and represents a series of workflows and operations of the user interface application to be expected based on a design requirement. A processor calculates a first set of hash-values for each corresponding expected image frame. A processor samples the user interface application with a frequency to a plurality of testing image frames during a test run on the user interface application. A processor calculates a second set of hash-values for each sampled testing image frame. A processor compares the first set of hash-values to the second set of hash-values. A processor verifies that the second set of hash-values matches the first set of hash-values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.