Electronic detection interface and electronic detection module using the same
US12148786B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 9, 2023 |
| Grant date | Nov 19, 2024 |
| Priority date | — |
| Expiry date | Nov 9, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/802
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electronic detection interface for testing micro photoelectric chips or micro semiconductor chips comprises a substrate structure and a plurality of detection units in array, responsive to the micro photoelectric chips or the micro semiconductor chips. The substrate structure includes a circuit layer, which comprises a plurality of circuit units in array. The detection units are disposed on a surface of the substrate structure, and are corresponded to the circuit units in a respect manner. Each of the detection units includes at least one resilient conductive pillar, which is electrically connected to each of the circuit units. Each of the resilient conductive pillars comprises a non-conductive photoresist and a conductive layer entirely covering the non-conductive photoresist.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.