Self-radiated loopback test procedure for millimeter wave antennas
US12149295B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 2023 |
| Grant date | Nov 19, 2024 |
| Priority date | — |
| Expiry date | Feb 1, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q21/08
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.