Time delay integration (TDI)-based image sensor and imaging method thereof
US12149846B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 15, 2021 |
| Grant date | Nov 19, 2024 |
| Priority date | — |
| Expiry date | Dec 31, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K21/38
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are a time delay integration (TDI)-based image sensor and an imaging method thereof. The TDI-based image sensor includes: a multi-stage linear array including a plurality of single-stage linear arrays arranged along a scanning direction of the image sensor. Each single-stage linear array includes a plurality of pixels arranged along the linear array direction. Each single-stage linear array enters a count mode in response to a first control signal, and enters a transfer mode in response to a second control signal. In the count mode, each single-stage linear array counts optical signals incident on the pixels and obtains a count value, and in the transfer mode, each single-stage linear array stops counting, except for the last single-stage linear array, other single-stage linear arrays each output the obtained current count value to the next single-stage linear array, and the last single-stage linear array outputs the obtained current count value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.