Patent · US Active

System and method for correcting machine load effect on kinematic accuracy

US12153395B2 · kind B2 · utility

0Cited by
7References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 11, 2022
Grant dateNov 26, 2024
Priority date
Expiry dateJan 30, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/41114
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method for calibrating a machining system includes providing the machining system which includes a base, a cantilevered arm, and a rotary table positioned at the second arm end of the cantilevered arm. The rotary table is rotatable relative to the cantilevered arm about a first axis. The first axis has a first unloaded position and a first unloaded orientation with the machining system in an unloaded condition. The method further includes installing a measurement artifact on the rotary table, measuring a first position of the measurement artifact, and installing a load on the rotary table. The first axis has a first loaded position and a first loaded orientation with the machining system in a loaded condition. The method further includes measuring a second position of the measurement artifact and determining a positional deviation of the second position from the first position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.