Virtual sensor on a higher-level machine platform

US12153413B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• André Geitner · Eggolsheim, DE
• Udo Heckel · Wendelstein, DE
• Tim Kaiser · Berlin, DE
• Daniel Klein · Mountain View, US
• Daniel Petzold · Fürth, DE
• Edison de Faria Siqueira · Nuremberg, DE

Key dates

• Filing date: Feb 28, 2020
• Grant date: Nov 26, 2024
• Expiry date: Jun 1, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G05B2219/37537
• WIPO field: Control
• WIPO sector: Instruments

Abstract

The invention relates to a method for providing a virtual sensor in an automation system of an industrial system. A measurement value of a physical sensor, said measurement value corresponding to a physical parameter of the industrial system, is received in a processing device of the automation system. A data set which has been generated using a simulation model is provided in the processing device, wherein the data set produces a unique relationship between possible measurement values of the physical sensor and corresponding output values of the virtual sensor. The data set and the received measurement value are used to determine which output value of the virtual sensor belongs to the received measurement value (20), and said output value is then displayed on a display device of the industrial system.