Quality estimation models for various signal characteristics
US12153648B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 15, 2021 |
| Grant date | Nov 26, 2024 |
| Priority date | — |
| Expiry date | Aug 4, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG10L21/0208
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This document relates to training and employing of quality estimation models to estimate the quality of different signal characteristics. One example includes a method or technique that can be performed on a computing device. The method or technique can include obtaining training signals exhibiting diverse impairments introduced when the training signals are captured or diverse artifacts introduced by different processing characteristics of a plurality of data enhancement models. The method or technique can also include obtaining quality labels for different signal characteristics of the training signals. The method or technique can also include training at least two different quality estimation models to estimate quality of at least two different signal characteristics based at least on the training signals and the quality labels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.