Image defect detection method for locating a defect of a to-be detected image, electronic device, and storage medium
US12154262B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 11, 2021 |
| Grant date | Nov 26, 2024 |
| Priority date | — |
| Expiry date | Jun 10, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20221
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided are an image defect detection method and apparatus, an electronic device, a storage medium and a product. The method includes acquiring a to-be-detected image; obtaining a restored image corresponding to the to-be-detected image based on the to-be-detected image, at least one mask image group and a plurality of defect-free positive sample images, where each mask image group includes at least two binary images having a complementary relationship, and different mask image groups have different image sizes; and locating a defect of the to-be-detected image based on the to-be-detected image and each restored image. The solution solves the problem in which a related defect detection method requires numerous manual operations and has a low detection accuracy due to subjective factors of a worker.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.