Patent · US Active

Text image defect detection method, computer device, and storage medium

US12154355B2 · kind B2 · utility

0Cited by

1References

20Claims

0Family size

Assignee

HON HAI PRECISION INDUSTRY CO., LTD. · TW

Inventors

Yen-Yi Lin · Plano, US
Hui Yang · Beijing, CN

Key dates

Filing date	Jun 23, 2022
Grant date	Nov 26, 2024
Priority date	—
Expiry date	Jul 25, 2043

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

This application provides an image defect detection method. The method includes obtaining a first image and a second image of a flawless image. A third image is obtained from the second image and the first image, and a fourth image is obtained according to the second image and an image to be detected. A fifth image is obtained based on the third image and the second image. A sixth image is obtained based on the third image and the fourth image. A seventh image is obtained from the fifth image and the sixth image. A defect value of the fourth image is obtained according to the third image and the seventh image. A detection result of the fourth image is determined based on the defect value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.