Method and system for calibrating an X-ray emitter
US12156321B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 26, 2022 |
| Grant date | Nov 26, 2024 |
| Priority date | — |
| Expiry date | Dec 30, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/265
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
One or more example embodiments relates to a method for calibrating an X-ray emitter having a cathode, an anode and a coil, wherein the coil is connected to a conductor arrangement through which an electrical function current is guided through the coil. The method comprises measuring an induction current that is induced in the coil at the conductor arrangement of the coil; calculating a compensation current for an effecting coil of the X-ray emitter based on the measured induction current, the effecting coil configured to change an electron beam between the cathode and the anode, wherein the compensation current is calculated such that a magnetic field that induces the induction current during the measuring is compensated using a magnetic field that is produced by the compensation current in the effecting coil; and applying the compensation current in the effecting coil.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.