Phase distortion measurement
US12158491B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2022 |
| Grant date | Dec 3, 2024 |
| Priority date | — |
| Expiry date | May 29, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2633
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test circuit for measuring phase distortion includes a first laser, a second laser and a photo diode. The first laser is tuned to a first frequency f1 and generates a first optical signal. The second laser is tuned to a second frequency f2 and generates a second optical signal and phase modulates the second optical signal with a periodic signal with a repetition frequency fM. The photo diode receives and mixes the first optical signal and the second optical signal, and produces a first tone at a third frequency f3, which is a carrier frequency equal to an absolute value of a difference between the second frequency f2 and the first frequency f1, a second tone at a fourth frequency f4 at a difference between the third frequency f3 and the repetition frequency fM, and a third tone at a fifth frequency f5 at a sum of the third frequency f3 and the repetition frequency fM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.