Self-adaptive test method for intelligent prediction algorithm of analog measured values
US12158741B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2020 |
| Grant date | Dec 3, 2024 |
| Priority date | — |
| Expiry date | Dec 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/2639
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
The present disclosure provides a self-adaptive test method for an intelligent prediction algorithm of analog measured values. Firstly, an event recording sequence, an analog measurement point ID and an analog measurement point alarm value are read from a time sequence event record table, an analog measurement point table and an alarm threshold table. Next, operation records of a normal operation state of a unit within a statistical cycle are acquired to form historical statistics of measured values of the analog measurement point based on switching value signals. Then, simulated measured values of the analog measurement point with time scales are calculated based on the historical statistics, the analog measurement point alarm value and an analog measurement point current measured value. Finally, sensitivity is calculated; and an alarm is sent to remind a technician to adjust the algorithm when the sensitivity is greater than a threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.