Patent · US Active

Analysis device, analysis system, analysis method, and storage medium

US12158744B2 · kind B2 · utility

0Cited by
0References
11Claims
0Family size

Assignee

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Key dates

Filing dateMar 2, 2022
Grant dateDec 3, 2024
Priority date
Expiry dateApr 12, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/23219
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

According to one embodiment, an analysis device performs an analysis related to a plurality of tasks of a manufacturing process. The analysis device receives an image when each of the plurality of tasks is performed. The analysis device receives the images from an imaging device acquiring the images. The analysis device receives a detection signal from a tool used in at least one of the plurality of tasks. The detection signal is detected by the tool. The analysis device refers to end determination data for determining an end of each of the plurality of tasks. The analysis device determines the end of each of the plurality of tasks based on the images, the detection signal, and the end determination data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.