Machine learning assisted super resolution microscopy
US12159369B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 6, 2022 |
| Grant date | Dec 3, 2024 |
| Priority date | — |
| Expiry date | Jul 20, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T3/4046
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of providing super-resolved images of a photon emitting particle is disclosed, which includes providing a machine-learning (ML) platform, wherein the ML platform is configured to receive pixel-based sparse autocorrelation data and generate a predicted super-resolved image of a photon emitting particle, receiving photons from the photon emitting particle by two or more photon detectors, each generating an electrical pulse associated with receiving an incident photon thereon, generating sparse autocorrelation data from the two or more photon detectors for each pixel within an image area, and inputting the pixel-based sparse autocorrelation data to the ML platform, thereby generating a predicted super-resolved image of the imaging area, wherein the resolution of the super-resolved image is improved by √n as compared to a classical optical microscope limited by Abbe diffraction limit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.