System and method for identifying and analyzing desired properties of a material
US12159395B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2021 |
| Grant date | Dec 3, 2024 |
| Priority date | — |
| Expiry date | Mar 6, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method including generating a plurality of synthetic images of a material, where each synthetic image from among the plurality of synthetic images is associated with a feasibility value greater than a threshold synthetic feasibility value. The method includes determining, for each synthetic image from among the plurality of synthetic images, one or more material properties of the material and one or more process parameters of the material based on the synthetic image and generating a plurality of data points and a pareto surface based on the one or more material properties and the one or more process parameters. The method includes selecting a target data point based on the plurality of data points and a distance between a set of data points from among the plurality of data points and the pareto surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.