Three-dimensional measurement system and three-dimensional measurement method
US12159425B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 22, 2019 |
| Grant date | Dec 3, 2024 |
| Priority date | — |
| Expiry date | Oct 20, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional measurement system projects patterned light onto a target object, images the target object from different viewpoints to obtain a first image and a second image, obtains first depth information using the first image with a spatially encoded pattern technique, defines a search range for a corresponding point based on parallax between the first image and the second image predicted from the first depth information, and obtains second depth information by performing stereo matching for the defined search range using the first image and the second image. The second depth information has a higher spatial resolution than the first depth information. The patterned light has a combined pattern combining a spatially encoded pattern including a plurality of unit elements arranged regularly and a random pattern including a plurality of random pieces arranged randomly. Each of the plurality of unit elements is an area corresponding to a depth value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.