Test system and test method
US12160277B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 13, 2022 |
| Grant date | Dec 3, 2024 |
| Priority date | — |
| Expiry date | May 10, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A test system for testing a device under test is described. The test system includes a testing circuit and the device under test. The testing circuit is configured to establish a wireless connection with the device under test based on a wireless communication standard having a low energy protocol. The wireless connection includes a plurality of channels, wherein the plurality of channels is configured to transmit data packages between the testing circuit and the device under test. The testing circuit and the device under test are configured to communicate with each other via the plurality of channels by a channel hopping technique. A radio frequency (RF) level of a signal transmitted by the testing circuit in at least one test channel to be tested, which belongs to the plurality of channels, is lower than an RF level of a signal transmitted by the testing circuit in at least one other channel of the plurality of channels. Further, a test method of testing a device under test is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.