Patent · US Active

System with substrate carrier deterioration detection and repair

US12162134B2 · kind B2 · utility

0Cited by
10References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 17, 2023
Grant dateDec 10, 2024
Priority date
Expiry dateFeb 17, 2043

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49771
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system includes a plurality of semiconductor processing tools; a carrier purge station; a carrier repair station; and an overhead transport (OHT) loop for transporting one or more substrate carriers among the plurality of semiconductor processing tools, the carrier purge station, and the carrier repair station. The carrier purge station is configured to receive a substrate carrier from one of the plurality of semiconductor processing tools, purge the substrate carrier with an inert gas, and determine if the substrate carrier needs repair. The carrier repair station is configured to receive a substrate carrier to be repaired and replace one or more parts in the substrate carrier.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.