Method and apparatus to inject errors in a memory block and validate diagnostic actions for memory built-in-self-test (MBIST) failures
US12164401B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2023 |
| Grant date | Dec 10, 2024 |
| Priority date | — |
| Expiry date | Jun 21, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory built in self test (MBIST) controller of an MBIST circuit outputs first data. One or more errors is injected in the first data to produce second data. The second data is stored in the memory block. The memory block outputs the second data stored in the memory block. The MBIST controller receives the second data and detects an error in the second data based on a comparison with the first data, the error indicative of a failure of the MBIST. The MBIST controller provides an indication of failure of the MBIST to a processing core external to the MBIST circuit which performs diagnostic action in response to receiving the indication of failure of the MBIST. The processing core validates implementation of the diagnostic action.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.