Image analysis system and operating method of the same
US12164602B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2021 |
| Grant date | Dec 10, 2024 |
| Priority date | — |
| Expiry date | Jun 16, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/32
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is an image analysis system which includes a first analyzer and a second analyzer. The first analyzer generates first features by encoding images through a first model and adjusts a weight of the first model based on the first features. The second analyzer generates second features based on the first features by encoding the images through a second model, classifies the second features into classes, respectively, and adjusts a weight of the second model based on mutual information and a correlation between a first class among the classes which features corresponding to an original image group from among the second features are classified as and a second class among the classes which features corresponding to an augmentation group of the original image group from among the second features are classified as.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.