System, method, and computer program for test-related automatic tracing
US12169449B1 · kind B1 · utility
0Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2023 |
| Grant date | Dec 17, 2024 |
| Priority date | — |
| Expiry date | Jun 30, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3692
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
As described herein, a system, method, and computer program are provided for test-related automatic tracing. A new requirement defined for an application is identified. The new requirement is processed, using a machine learning model, to predict each portion of the new requirement covered by existing test features. One or more new test features are caused to be created for the new requirement, based on the prediction of each portion of the new requirement covered by existing test features.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.