System and method for set up of production line inspection
US12169924B2 · kind B2 · utility
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13Claims
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Key dates
| Filing date | Jan 23, 2023 |
| Grant date | Dec 17, 2024 |
| Priority date | — |
| Expiry date | Jan 23, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic inspection process for detecting visible defects on a manufactured item, the process including a set up mode in which images of same-type defect free items, but not images of same-type defected items, are obtained, and an inspection mode in which images of both same-type defect free items and same-type defected items, are obtained and defects are detected, where images of the same-type defect free items are analyzed and based on the analysis the process switches to the inspection mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.