Apparatus for measuring dynamic on-resistance of nitride-based semiconductor device
US12174229B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 13, 2022 |
| Grant date | Dec 24, 2024 |
| Priority date | — |
| Expiry date | Jul 13, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2607
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring dynamic on-resistance of a device under test (DUT) is provided. The apparatus comprises a testing interface configured for coupling between the DUT and a measuring equipment; a first measuring circuit configured for sensing a drain-source voltage of the DUT and generating a first measuring signal proportional to the drain-source voltage; a current sensing circuit configured for sensing a drain current flowing from a drain to a source of the DUT and generating a current sensing signal; a second measuring circuit configured for receiving the current sensing signal and generating a second measuring signal proportional to the drain current; a first clamping circuit configured for eliminating overshoots in the first measuring signal; a second clamping circuit configured for eliminating overshoots in the second measuring signal. As the overshoot in the measuring voltage signals can be eliminated, the time required for the measuring signal to settle is shortened.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.