Patent · US Active

System and method for measuring resonance frequencies of quantum sensor based on multi-photon excitation

US12174234B1 · kind B1 · utility

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9Claims
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Key dates

Filing dateMar 11, 2024
Grant dateDec 24, 2024
Priority date
Expiry dateMar 11, 2044

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R29/0885
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present disclosure provides a system and method for measuring resonance frequencies of a quantum sensor based on multi-photon excitation. The system includes a probe laser module, a coupling laser module, a quantum sensor, a fast measurement module, an experimental signal source, and a measurement and calculation module. The experimental signal source directly faces the quantum sensor, and is configured to transmit a RF electromagnetic signal to the quantum sensor. The quantum sensor includes a closed glass cavity. An alkali metal atomic vapor is enclosed in the glass cavity. The probe laser module is connected to one side of the quantum sensor, and the coupling laser module is connected to the other side of the quantum sensor through the fast measurement module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.