Probe assembly, system and method for testing rf device of phased array antenna
US12174243B2 · kind B2 · utility
0Cited by
5References
20Claims
0Family size
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Key dates
| Filing date | Dec 14, 2022 |
| Grant date | Dec 24, 2024 |
| Priority date | — |
| Expiry date | Apr 14, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for manufacturing a first radio-frequency (RF) device, including: receiving a substrate having the first RF device, wherein the first RF device has a signal port for receiving or transmitting RF signals with an input impedance greater than ten times an input impedance of a testing tool; causing a probe assembly to connect to the signal port and the testing tool; and causing the probe assembly to connect to a first terminal of a resistive element having a resistance equal to the input impedance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.