Distributed analysis X-ray inspection methods and systems
US12174334B2 · kind B2 · utility
2Cited by
690References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 5, 2021 |
| Grant date | Dec 24, 2024 |
| Priority date | — |
| Expiry date | Feb 13, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30248
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.