Patent · US Active

Data inspection system and method

US12175007B2 · kind B2 · utility

0Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 2023
Grant dateDec 24, 2024
Priority date
Expiry dateJun 30, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L63/20
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

A system continuously monitors, by at least one inspector, an inspection work queue for a class of inspection operation request, detects, by the at least one inspector, the class of inspection operation request in the inspection work queue, removes, by the at least one inspector, the class of inspection operation request from the inspection work queue, determines, by the at least one inspector, one of a class of inspection tool and a specific level of inspection to perform for the class of inspection operation request that references a data object, and executes, by the at least one inspector, the one of the class of inspection tool and the specific level of inspection for the class of inspection operation request that references the data object at one of a certain time and a certain event during a data lifecycle of the data object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.