Probe module for inspecting display panel, panel inspection apparatus including the same, and panel correction method of panel inspection apparatus
US12175942B2 · kind B2 · utility
0Cited by
2References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 19, 2021 |
| Grant date | Dec 24, 2024 |
| Priority date | — |
| Expiry date | Nov 19, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2360/16
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Provided are a probe module for inspecting a display panel, a panel inspection apparatus including the same, and a panel correction method of the panel inspection apparatus, which are provided to correct a display panel selected as a defective display panel during manufacturing of the display panel, thereby improving manufacturing yield of the display panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.