Patent · US Active

Magnetic field sensor and method for measuring a magnetic field

US12181546B2 · kind B2 · utility

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16Claims
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Key dates

Filing dateFeb 9, 2023
Grant dateDec 31, 2024
Priority date
Expiry dateJul 13, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/323
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring a magnetic field includes radiating a microwave field having a first frequency into at least one measuring location in a crystal, which comprises optically excitable color center defects at the measuring location, radiating excitation light and detecting resulting fluorescence light, applying a deformation force which results in local mechanical strain, wherein an applied first deformation force is selected such that the first frequency corresponds to a resonance frequency of the color center defects under the action of the first deformation force without the magnetic field to be measured and the detected fluorescence light becomes minimal. The method further includes placing the sensor into the magnetic field to be measured to bring about a shift in the resonance frequency and varying the applied deformation force to compensate the shift in the resonance frequency until a minimum fluorescence signal is again acquired at a second deformation force.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.