Truncated nonlinear interferometer-based sensor system
US12181773B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2023 |
| Grant date | Dec 31, 2024 |
| Priority date | — |
| Expiry date | Apr 26, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/55
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A truncated non-linear interferometer-based sensor system includes an input port that receives an optical beam and a non-linear amplifier that amplifies the optical beam with a pump beam and renders a probe beam and a conjugate beam. The system's local oscillators have a relationship with the respective beams. The system includes a sensor that transduces an input with the probe beam and the conjugate beam or their respective local oscillators. It includes one or more phase-sensitive detectors that detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. Output from the phase-sensitive-detectors is based on the detected phase modulation. The phase-sensor-detectors include measurement circuitry that measure the phase signals. The measurement is the sum or difference of the phase signals in which the measured combination exhibit a quantum noise reduction in an intensity difference or a phase sum or an amplitude difference quadrature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.