Characterization of time-correlated quantum errors through entanglement
US12182665B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 27, 2021 |
| Grant date | Dec 31, 2024 |
| Priority date | — |
| Expiry date | Jul 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N10/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Errors that affect a quantum computer can be efficiently measured and characterized by placing the quantum computer in a highly-entangled state such as a Greenberger-Horne-Zeilinger (GHZ) state, accumulating quantum errors in the highly entangled state, and then measuring the accumulated errors. In some approaches, the error characterization includes measuring parity oscillations of the GHZ state and fitting a quantum error model to a power spectrum of the parity oscillations. The fitted quantum error model can be used to select a suitable fault-tolerant error correction scheme for the quantum computer given its environmental noise.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.