Machine learning to determine facial measurements via captured images
US12190634B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 27, 2021 |
| Grant date | Jan 7, 2025 |
| Priority date | — |
| Expiry date | Nov 28, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30201
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques for automated facial measurement are provided. A set of coordinates for a set of landmarks on a face of a user are extracted by processing an image using a machine learning model. An orientation of the face of the user is determined. It is determined that impedance conditions are not present in the images, and a reference distance on the face of the user is estimated based on the image, where the image depicts the user facing towards the imaging sensor. A nose depth of the user is estimated based on a second image based at least in part on the reference distance, where the second image depicts the user facing at an angle relative to the imaging sensor. A facial mask is selected for the user based on the nose depth.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.