Defect identification method, and array detection probe
US12196710B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 14, 2024 |
| Grant date | Jan 14, 2025 |
| Priority date | — |
| Expiry date | May 14, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are an alternating current field based defect identification method and an array detection probe. The evaluation method includes the following steps: obtaining a magnetic field Bx signal in direction X and a magnetic field Bz signal in direction Z; removing a background magnetic field of each of the magnetic field Bx signal in the direction X and the magnetic field Bz signal in the direction Z, and obtaining a magnetic field Bx1 signal in the direction X and a magnetic field Bz1 signal in the direction Z without background magnetic fields; drawing an array image of the Bx1 signal and an array image of the Bz1 signal; and locating a distortion zone corresponding to disturbance at the same time and position in the array image of the Bx1 signal and the array image of the Bz1 signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.