Patent · US Active

Inferring facility planograms

US12198179B1 · kind B1 · utility

0Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 5, 2023
Grant dateJan 14, 2025
Priority date
Expiry dateSep 5, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V20/44
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

This disclosure describes techniques for updating planogram data associated with a facility. The planogram may indicate, for different shelves and other inventory locations within the facility, which items are on which shelves. For example, the planogram data may indicate that a particular item is located on a particular shelf. Therefore, when a system identifies that a user has taken an item from that shelf, the system may update a virtual cart of that user to indicate addition of the particular item. In some instances, however, a new item may be stocked on the example shelf instead of a previous item. The techniques described herein may use sensor data generated in the facility to identify this change and update the planogram data to indicate an association between the shelf and the new item.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.