Systems and methods for measuring one or more metrics of a cryptographic algorithm in a post-quantum cryptography system
US12200116B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2022 |
| Grant date | Jan 14, 2025 |
| Priority date | — |
| Expiry date | Jul 7, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L9/0852
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Systems, apparatuses, and methods are disclosed for measuring one or more metrics of a cryptographic algorithm in a post-quantum cryptography (PQC) system. An example method includes obtaining a set of operating parameters comprising an algorithm of interest, wherein the algorithm of interest is a PQC algorithm, a legacy algorithm operating in a hybrid PQC system, or a variant thereof, and wherein the algorithm of interest is wrapped to present, via a wrapped algorithm of interest, a standardized interface to a sequence of benchmark operations. The example method further includes observing benchmark values of the one or more metrics, wherein the one or more metrics pertain to a designated benchmark operation from the sequence of benchmark operations. The example method further includes outputting a report comprising the benchmark values of the one or more metrics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.