Patent · US Active

System for determining optical probe location relative to a photonic integrated circuit

US12203739B2 · kind B2 · utility

0Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 2021
Grant dateJan 21, 2025
Priority date—
Expiry dateJan 14, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/4233
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for determining optical probe location relative to a photonic integrated circuit (PIC) is described. A diffractive optical element (DOE) disposed in the PIC, and has a focal point of absolute maximum reflection at location having coordinates in three-dimensions above the PIC. The system includes an optical waveguide probe, and an optical source adapted to provide light through the optical waveguide probe and incident on the DOE. The DOE reflects and focuses light back to the optical waveguide probe, and a power meter is adapted to receive at least a portion of the light reflected and focused at the focal point above the PIC. Based on the determination of a location of the absolute maximum reflection, consistent and reliable testing of PIC can be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.