Method and device for superresolution optical measurement using singular optics
US12203741B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 13, 2023 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Oct 13, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of optical measurement for determining a spatial position of at least one luminous object in a sample includes: projecting onto the sample a dynamically optimized sequence of compact luminous distributions of different topological families; wherein the dynamically optimized sequence is determined based on data selected from the group consisting of a positioning hypothesis and a first set of measures; for each compact luminous distribution in the optimized sequence, generating an image of the at least one luminous object as illuminated thereby; and algorithmically analyzing the generated images to obtain spatial position information of the at least one luminous object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.