Optical imaging system and method based on random light field spatial structure engineering
US12203845B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2021 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Apr 16, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/479
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical imaging system and a method based on spatial structure engineering of random light are disclosed. The method includes performing scattering processing on transmitted light to obtain a to-be-measured light; splitting polarization of the to-be-measured light. One light is split into x-polarized and y-polarized beams, and the other one is firstly combined with a reference beam and then split into x-polarized and y-polarized beams; measuring the intensity distributions of x-polarized and y-polarized parts of the to-be-measured light, the combined light, and the reference light; obtaining a real part and an imaginary part of the cross spectral density of the to-be-measured light, retrieving the intensity distribution of the light on the scattering medium and calculating the intensity to obtain the shape and location of the object to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.