Dark tracking, hybrid method, conical diffraction microscopy and dark addressing
US12203858B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 27, 2023 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Jan 27, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/066
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A super resolution technique, intended mainly for fluorescence microscopy, acquires the three-dimensional position of an emitter, through a hybrid method, including a number of steps.In a first step the two-dimensional position of an emitter is acquired, using a technique, named in this application as an Abbe's loophole technique. In this technique a doughnut, or a combination of distributions, having a zero intensity at the combined center of the distributions, is projected onto the sample containing the emitter, under conditions wherein the doughnut null is moved towards the emitter to reach a position in which the emitter does not emit light.In a second step, an axial measurement is obtained using a 3D shaping method, characterized by the fact that the emitted light is shaped by an additional optical module creating a shape of the light emitted by the emitter, this shape being dependent of the axial position and means to retrieve the axial position from the shape.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.