Patent · US Active

Method of detecting internal stress distribution of transparent material based on x-ray diffraction

US12203881B2 · kind B2 · utility

0Cited by

8References

5Claims

0Family size

Assignee

ZHEJIANG UNIVERSITY · CN

Inventors

Haikuo Wang · Hangzhou City, CN
Yao TANG · Tianjin, CN
Jiakun Wu · Nashville, US
Xiaoping Ouyang · Hunan, CN

Key dates

Filing date	Apr 24, 2024
Grant date	Jan 21, 2025
Priority date	—
Expiry date	Apr 24, 2044

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/1016
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of detecting internal stress distribution of a transparent material based on X-ray diffraction, which includes the following steps. Coordinates of stress detection positions of a transparent material are established. An initial powder of the transparent material and a standard reference material are processed. A placement coordinate position of the standard reference material on the transparent material is calculated. A standard reference material-containing transparent material is synthesized. Internal stress of the standard reference material is detected as the internal stress of the transparent material at the placement coordinate position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.