Methods and circuitry for built-in self-testing of circuitry and/or transducers in ultrasound devices
US12203894B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2023 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Nov 13, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M3/454
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.